It features the company’s hyMap sub-page-based flash translation layer, supporting unparalleled random write performance, minimal write amplification and high endurance without external DRAM. The newly introduced FlashXE (eXtended Endurance) read-channel includes calibration, error correction with soft-decoding and error prevention mechanisms for a wide range of flash technology including SLC, pSLC, 3D MLC, 3D TLC and the next generation of NAND flashes. Adherence to the highest industrial requirements is guaranteed by hyReliability flash management, which features wear leveling, read-disturb management and power-fail robustness. Furthermore, advanced protection against radiation and soft errors including end-to-end datapath protection, SRAM ECC and a low-alpha package ensure operation even under the most demanding conditions. The controller achieves transfer speeds of up to 550 MB/s. Exhaustive health-monitoring data exceeding the usual S.M.A.R.T. scope is provided together with lifetime estimation tools. The X1 will initially be available in 144-ball TFBGA (10.4x10.4x1.1mm) and 124-ball TFBGA (9x9x1.2mm) packages, qualified for the -40 to +85°C temperature range.
Hyperstone - www.hyperstone.com
